Preface

Author Index

List of Participants

p.1 XRM 2005 - Conference Summary

J. Kirz

p.3 Presentation of the Werner Meyer-Ilse Award

C. Jacobsen

p.4 Zone Plate Microscopy to Sub-15 nm Spatial Resolution with XM-1 at the ALS

W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson and D. T. Attwood

p.7 A Full-Field KB-FZP Microscope for Hard X-Ray Imaging with Sub-100 nm Resolution

C. Rau, V. Crecea, K. M. Peterson, P. R. Jemian, C.-P. Richter, U. Neuhäusler, G. Schneider, X. Yu, P. V. Braun and I. K. Robinson.

p.9 Development of a Soft X-Ray Microscope with Wolter Mirrors for the Observation of Biological Specimens in the Atmospheric State

M. Hoshino and S. Aoki

p.12 Towards Compact X-Ray Microscopy with Liquid-Nitrogen-Jet Laser-Plasma Source

P. A. C. Takman, U. Vogt and H. M. Hertz

p.15 Hard X-Ray Microscopy with Sub-30 nm Spatial Resolution at NSRRC

M.-T. Tang, G.-C. Yin, Y.-F. Song, J.-H. Chen, K.-L. Tsang, K. S. Liang, F.-R. Chen, F. Duewer and W. Yun

p.18 X-Ray Micro-Analysis Activities at the ESRF

J. Susini, M. Salomé, R. Tucoulou, G. Martinez-Criado, S. Bohic, D. Eichert, P. Bleuet, I. Letard, M. Cotte, J. Cauzid, B. Fayard, R. Baker and S. Labouré

p.22 TwinMic - A European Twin X-Ray Microscopy Station Commissioned at ELETTRA

B. Kaulich, D. Bacescu, J. Susini, C. David, E. Di Fabrizio, G. R. Morrison, P. Charalambous, J. Thieme, T. Wilhein, J. Kovac, D. Cocco, M. Salome, O. Dhez, T. Weitkamp, S. Cabrini, D. Cojoc, A. Gianoncelli, U. Vogt, M. Podnar, M. Zangrando, M. Zacchigna and M. Kiskinova

p.26 The Hard X-Ray Nanoprobe Beamline at the Advanced Photon Source

J. Maser, R. Winarski, M. Holt, D. Shu, C. Benson, B. Tieman, C. Preissner, A. Smolyanitskiy, B. Lai, S. Vogt, G. Wiemerslage and G. B. Stephenson

p.30 The Transmission Soft X-Ray Microscope Project at NSRL

S. Jiang, L. Chen, L. Wan and F. Xu

p.32 Nano-Positioning Control of Condenser Mirror for Soft X-Ray Microscopy System Using 5-Axis Manipulator

J. H. Kim, K. G. Kim, J. H. Min, K. W. Kim, Y. M. Kwon, J. Y. Min and K. H. Yoon

p.35 High Resolution X-Ray Inspection Microscope Equipped with a Field Emission Gun, and Its Application

Y. Saito, H. Kai, K. Shirota and K. Yada

p.38 Automatic Alignment of Soft X-Ray Microscope Condenser Mirror Using Response Surface Method

T. Kim, D. Kang, H. You, S. Kang, D.-G. Gweon and K.-H. Youn

p.41 Development of a Laser Plasma X-Ray Microscope to Observe Live Hydrated Biological Specimens

M. Kado, H. Daido, Y. Yamamoto, K. Shinohara and M. C. Richardson

p.44 Microfocusing of Quasi-Monochromatic X-Ray Undulator Radiation Using Fresnel Zone Plate Optics

Y. Suzuki, A. Takeuchi, K. Uesugi, K. Inoue, H. Takano and T. Oka

p.47 X-Ray Imaging Microscopy at 82 keV with Sputtered-Sliced Fresnel Zone Plate Objective

Y. Suzuki, A. Takeuchi, K. Uesugi, M. Awaji, M. Yasumoto, S. Tamura and N. Kamijo

p.50 X-Ray Microscope with a Gas-Puff Plasma X-Ray Source and Grazing Incidence Mirrors

A. Ohba, T. Nakano, S. Onoda and M. Sugiyama

p.53 Present Status of Hard X-Ray Micro-Imaging at BL24XU of SPring-8

Y. Kagoshima, T. Koyama, A. Saikubo, K. Shimose, K. Hayashi, A. Nakagawa, H. Takano, Y. Tsusaka, J. Matsui, M. Kotera and K. Izumi

p.56 Precision Mechanical Design for a Hard X-Ray Nanoprobe Instrument with Active Vibration Control in Nanometer Scale

D. Shu, J. Maser, B. Lai, S. Vogt, M. Holt, C. Preissner, A. Smolyanitskiy, B. Tieman, R. Winarski and G. B. Stephenson

p.59 Scanning Hard-X-Ray Microscope with Spatial Resolution Better than 50 nm Using K-B Mirror Optics

S. Matsuyama, H. Mimura, H. Yumoto, H. Hara, K. Yamamura, Y. Sano, K. Endo, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa and K. Yamauchi

p.62 A Transmission X-Ray Microscope for Magnetic Imaging at BESSY II

T. Eimüller, U. Englisch, S. Seiffert, R. Vatter, C. Wolter, M. Bechtel, H. D. Carstanjen and G. Schütz

p.65 Development of μ-XPS System for 6 nm X-Ray

Y. Takemura, N. Yamaguchi, Z. Takahashi, Y. Nishimura and T. Hara

p.68 Low-Energy Electron Excited X-Ray Microscope

K. Ueda

p.70 Full-Field Soft X-Ray Microscope at Pohang Light Source

G. B. Kim, H. J. Shin, C. K. Hong, C. C. Hwang, J. G. Kim, K. W. Kim, K. S. Choi, K. H. Yoon and D. E. Kim

p.73 Helical-Undulator Beamline for Soft X-Ray Spectromicroscopy at Saga LS

M. Yasumoto, K. Takemoto, E. Ishiguro, H. Kihara, N. Kamijo and Y. Chikaura

p.76 A μ-XAS and μ-XRF Setup for the 6-13 keV X-Ray Energy Range Based on Wide Band Kirkpatrick-Baez Optics

E. Ziegler, A. Somogyi, T. Bigault, C. Borel, C. Morawe, O. Hignette, G. Rostaing, P. van Vaerenbergh and J.-Y. Massonnat

p.79 A New Optical Design for Compact Soft X-Ray Microscope

K.-W. Kim, Y.-M. Kwon, K.-G. Kim, K.-Y. Nam, D.-W. Kang, S.-H. Kang, D.-G. Gweon, S. Rah, J.-Y. Min and K.-H. Yoon

p.82 Automated Soft X-Ray Microscope Station at Ritsumeikan University Synchrotron Radiation Center

M. Kimura, K. Takemoto and H. Kihara

p.85 CaPeRS and Lox: Prospects for Photoelectron Emission Spectromicroscopy at the Canadian Light Source

U. D. Lanke, A. P. Hitchcock, P. Hitchcock, J. Stewart-Ornstein, K. Kaznatcheev, A. Kolmakov, I. Annesley, A. McCready and S. G. Urquhart

p.88 High Spatial Resolution Scanning Transmission X-Ray Microscopes at the Advanced Light Source (abstract)

T. Tyliszczak, A. L. D. Kilcoyne, T. Warwick, A. Liddle and D. K. Shuh

p.89 The Scanning Photoemission Microscope at Elettra: Recent Results and Developments (abstract)

L. Gregoratti, L. Aballe, A. Barinov, P. Doudine and M. Kiskinova

p.90 Sub-10 nm X-Ray Microscopy: Status and Pathways (abstract)

W. Yun

p.91 Towards Soft X-Ray Phase-Sensitive Imaging with Diffractive Optical Elements

U. Vogt, M. Lindblom, P. A. C. Jansson, T. T. Tuohimaa, A. Holmberg, H. M. Hertz, M. Wieland and T. Wilhein

p.94 Hard X-Ray Nanoprobe with Refractive X-Ray Lenses

C. G. Schroer, O. Kurapova, J. Patommel, P. Boye, J. Feldkamp, B. Lengeler, M. Burghammer, C. Riekel, L. Vincze, A. van der Hart and M. Küchler

p.97 Practical Use of Quasi-Kinoform Zone Plate: Towards High-Efficiency Microbeam for Hard/High-Energy X-Rays

N. Kamijo, Y. Suzuki, S. Tamura, A. Takeuchi and M. Yasumoto

p.100 Hard X-Ray Diffraction-Limited Nanofocusing with Unprecedentedly Accurate Mirrors

H. Mimura, S. Matsuyama, H. Yumoto, H. Hara, K. Yamamura, Y. Sano, K. Endo, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa and K. Yamauchi

p.103 Volume Zone Plate Development at BESSY

S. Rehbein and G. Schneider

p.107 Multilayer Fresnel Zone Plate with High Diffraction Efficiency for High Energy X-Ray Region at AIST and SPring-8

S. Tamura, M. Yasumoto, N. Kamijo, M. Awaji, A. Takeuchi, K. Uesugi, Y. Terada, Y. Suzuki and H. Takano

p.110 Progress of the Fabrication of Soft X-Ray Zone Plates at NSRL

Y. Liu, K. Xiao, X. Xu, Y. Hong and S. Fu

p.112 Hard X-Ray Microbeam and Scanning Microscopy Using Fresnel Zone Plate with 50 nm Outermost Zone Width

A. Takeuchi, Y. Suzuki, H. Takano and H. Takenaka

p.115 Hard X-Ray Imaging and Microscopy with Lithographic CRL Developed at ANKA Synchrotron Radiation Facility

R. Simon, V. Nazmov, E. Reznikova, J. Mohr and V. Saile

p.117 Zone Plate Fabrication Method for Optimized Profiles

G. Denbeaux, R. Garg, T. C. Stoner, M. Hooker and S. Wang

p.119 Diffraction Efficiency of Multi-Level Zone Plate Fabricated by Sputtered-Sliced Method for Hard X-Ray Focusing

M. Yasumoto, S. Tamura, N. Kamijo, Y. Suzuki and A. Takeuchi

p.121 Fabrication of a Condenser Mirror for a Soft X-Ray Microscope

K. S. Chon, Y. Namba and K.-H. Yoon

p.124 Nickel Zone Plates for Compact Soft X-Ray Microscopy

A. Holmberg, M. Lindblom, S. Rehbein and H. M. Hertz

p.127 Status of Nanofabrication at ZonePlates.com

P. Charalambous

p.130 Portable Synchrotron Hard X-Ray Source MIRRORCLE-6X for X-Ray Imaging

H. Yamada, T. Hirai, M. Morita, T. Hanashima, M. Sasaki, D. Hasegawa, T. Hayashi, T. Yamada and H. Saisho

p.133 Development of High-Average Power Extreme Ultraviolet Source by Laser Produced Plasmas

H. Nishimura, K. Nishihara, S. Fujioka, Y. Tao, T. Aota, N. Ueda, T. Ando, Y. Simada, M. Yamaura, K. Hashimoto, S. Uchida, Q. Gu, K. Nagai, T. Norimatsu, A. Sunahara, H. Furukawa, Y.-G. Kang, M. Murakami, H. Yoshida, K. Tsubakimoto, H. Fujita, M. Nakatsuka, N. Miyanaga, Y. Izawa and K. Mima

p.137 Direct Micromachining of Inorganic Transparent Materials Using Laser Plasma Soft X-Rays

T. Makimura, H. Miyamoto, S. Uchida, H. Niino and K. Murakami

p.140 Laser-Plasma X-Ray Source Using Ceramic Target

N. Yamaguchi, Y. Takemura, H. Shoyama and T. Hara

p.143 New Type of Targets for Projection X-Ray Microscopy of Samples Consisting of Light Elements

K. Yada, A. Ito and Y. Kinjyo

p.145 Development of Laser-Based Water-Window Radiation Source Using Liquid-Jet Target

B. Kim, J. Kim, B. Ahn, D. Lee and D. E. Kim

p.148 Development of 50 Hz Laser-Produced Plasma Soft X-Ray Source Using Tape-Target

Y. Nishimura, Z. Takahashi, A. Sakata, H. Azuma, Y. Takemura, N. Yamaguchi and T. Hara

p.151 Extreme Ultraviolet Emission Characteristics of a Laser-Produced Li Plasma

T. Higashiguchi, C. Rajyaguru, K. Kawasaki, W. Sasaki and S. Kubodera

p.154 Study of Matrix Effect with a Full-Field Imaging X-Ray Fluorescence Microscope

T. Ohigashi, M. Hoshino, Y. Takeda, N. Yamada, T. Namiki, T. Ishino, N. Watanabe and S. Aoki

p.157 Development of a Large Angle X-Ray Spreading Element for Projection X-Ray Microscopy with Undulator Light Source

M. Awaji

p.159 Hard X-Ray Mirrors by Multilayer Replication: Developments and Application

R. Shibata, Y. Ogasaka, K. Tamura, A. Furuzawa, Y. Haba, Y. Tawara, H. Kunieda, T. Miyazawa, M. Naitoh, K. Shimoda, Y. Fukaya, T. Iwahara, K. Sakaki and H. Mutoh

p.162 A Compound Refractive Lens for 175-keV for Magnetic Compton Profile Measurements at SPring-8

A. Andrejczuk, Y. Sakurai and M. Itou

p.165 The Development of Hard X-Ray Optics for MIRRORCLE-6X Microscopy Beam Line

T. Hirai, H. Yamada, D. Hasegawa, Y. Ogasaka, H. Yamashita and T. Tokunaga

p.168 Investigation of Soft X-Ray Multilayer Fabrication by an In-Situ Ellipsometric Deposition Monitor

T. Tsuru, T. Harada and M. Yamamoto

p.171 Development of a Soft X-Ray Telescope with an Adaptive Optics System

S. Kitamoto, J. Satoh, T. Watanabe, K. Sudoh, T. Kohmura, N. Yamamoto, Y. Ohkubo, A. Sekiguchi, K. Suga and H. Sekiguchi

p.174 Fabrication and Characterization of Depth-Graded X-Ray Multilayers

Z. Wang, F. Wang, Z. Zhang, H. Wang and L. Chen

p.177 Design of the Broad Angular Multilayer Analyzer for Soft X-Ray and Extreme Ultraviolet

H. Wang, Z. Wang, F. Wang and L. Chen

p.180 Wide-Range Reflection Multilayer for Normal-Incidence Optics in the 200 - 25 nm Region

T. Ejima, A. Yamazaki, T. Banse and M. Watanabe

p.183 Accuracy Evaluation of the X-Ray Interferometer for Extreme Ultraviolet Lithography Optics

K. Otaki, K. Sugisaki, M. Okada, Z. Yucong, L. Zhiqiang, J. Saito, K. Murakami, C. Ouchi, S. Kato, M. Hasegawa, T. Hasegawa, A. Suzuki, H. Yokota and M. Niibe

p.186 Analytical Designing of Two-Aspherical-Mirror Anastigmat Permitting Practical Misalignments for Soft-X-Ray Imaging

M. Toyoda, M. Yamamoto and M. Yanagihara

p.189 Modification of a Laboratory Soft X-Ray Spectro-Reflectometer for Evaluation of a Spherical Mirror

T. Ohigashi, M. Furudate, T. Harada, K. Kaminishi and M. Yamamoto

p.192 A New Designed Ultra-High Precision Profiler − Study on Slope Error Measurement of a Mandrel for Wolter Type-I Mirror Fabrication −

Y. Higashi, Y. Takaie, K. Endo, T. Kume, K. Enami, K. Yamauchi, K. Yamamura, T. Sano, K. Ueno and Y. Mori

p.195 Narrow Band Mo/Si Multilayers with Thick Si Structures

T. Harada, T. Hatano and M. Yamamoto

p.198 Development of Beam Splitters for EUV Region

H. Takenaka, S. Ichimaru and E. M. Gullikson

p.201 Development of High Resolution Wide-Band X-Ray Detector: Scintillator-Deposited Charge-Coupled Device

K. Mukai, N. Tawa, K. Ikegami, T. Miyauchi, N. Anabuki, E. Miyata, H. Tsunemi, Y. Ogasaka, K. Tamura, R. Shibata and K. Miyaguchi

p.204 Development of X-Ray CCDs for the NeXT Satellite

D. Matsuura, H. Ozawa, M. Tohiguchi, N. Tawa, K. Mukai, T. Miyauchi, N. Anabuki, E. Miyata, H. Tsunemi, S. Takagi, T. Inui, H. Matsumoto, T. Tsuru, Y. Kamata, S. Miyazaki, K. Miyaguchi, M. Muramatsu and H. Suzuki

p.207 Contact X-Ray Microscopy and Micro-Radiography on Lithium Fluoride Detectors

S. Almaviva, G. Baldacchini, F. Bonfigli, F. Flora, A. Lai, T. Marolo, L. Mezi, R. M. Montereali, A. Cricenti, A. Ustione, A. Faenov, T. Pikuz, C. Bellecci, M. Francucci, P. Gaudio, S. Martellucci, M. Richetta, A. Rydzy, A. Reale, L. Reale, A. Ritucci, G. Tomassetti, L. Palladino, T. Limongi and M. A. Vincenti

p.210 Contribution of X-Ray Microscopy to Bone Mineral Studies

D. Eichert, M. Salome, P. Bleuet, S. Bohic and J. Susini

p.213 Micro XAFS Study of Live Ascidian Blood Cells by Scanning X-Ray Microscopy at ESRF ID21 Beamline

K. Takemoto, T. Ueki, B. Fayard, M. Salomé, J. Susini, A. Yamamoto, H. Sasaki, S. Scippa, H. Michibata and H. Kihara

p.217 Synchrotron Infrared Microspectroscopic Imaging of Biological Investigation

C.-I. Chen and Y.-C. Lee

p.219 Recent Observation of Biospecimens by Soft X-Ray Microscopy at Ritsumeikan University Synchrotron Radiation Center

K. Takemoto, K. Okuno, J. Minemoto, A. Yamamoto, B. Niemann, M. Hettwer, D. Rudolph, E. Anderson, D. Attwood, D. P. Kern, T. Okamoto and H. Kihara

p.222 Mapping of Intracellular Light Elements Including Ca, P and S in Mammalian Cells by Soft X-Ray Contact Microscopy

A. Ito, Y. Ohno and K. Shinohara

p.225 Micro-CT of Pseudocneorhinus bifasciatus by Projection X-Ray Microscopy

A. Tanisako, A. Hori, A. Okumura, C. Miyata, C. Kuzuryuu and H. Yoshimura

p.227 X-Ray Microscopy and Chromosome Research

Y. Kinjo, M. Watanabe, A. Ito and K. Shinohara

p.230 The BioCAT Microprobe for X-Ray Fluorescence Imaging, MicroXAFS and Microdiffraction Studies on Biological Samples

R. A. Barrea, D. Gore, E. Kondrashkina, T. Weng, R. Heurich, M. Vukonich, J. Orgel, M. Davidson, J. F. Collingwood, A. Mikhaylova and T. C. Irving

p.233 X-Ray CT and DEI Images of the Biological Soft-Tissue Using Synchrotron X-Rays

D. V. Rao, T. Yuasa, T. Akatsuka, Z. Zhong and T. Takeda

p.235 Images of the Rat Bone and Lumber Vertebra Using Diffraction-Enhanced Imaging Technique

D. V. Rao, T. Yuasa, T. Akatsuka, Z. Zhong and T. Takeda

p.237 Detection of Heavy Metals in Various Biological Samples

L. Reale, A. Lai, A. Faenov, T. Pikuz, F. Flora, L. Mezi, G. Baldacchini, L. Spanò, A. Poma, T. Del Borrello, A. Tucci, T. Limongi, L. Palladino, A. Ritucci, G. Tomassetti, A. Reale, M. Francucci, S. Martellucci, M. Richetta, A. Rydzy, P. Gaudio and C. Bellecci

p.239 Biological Nano-Tomography (abstract)

C. A. Larabell and M. A. Le Gros

p.240 3D Internal Strain Mapping by Tracking Microstructural Features in Tomographic Volumes of Structural Materials

H. Toda, N. Kuroda, M. Takata, K. Uesugi, T. Ohgaki, M. Kobayashi, K. Makii, Y. Aruga, T. Akahori, M. Niinomi and T. Kobayashi

p.243 X-Ray Microscopy Studies of Electromigration in Integrated Circuits

P. Guttmann, S. Rudolph, S. Heim, S. Rehbein, M. A. Meyer, G. Schneider and E. Zschech

p.246 X-Ray Absorption Spectromicroscopic Analysis of SAM-Functionalized Surface

Y. J. Hsu, W. S. Hu, Y. T. Tao, D. H. Wei, J.-H. Sun, C.-H. Chen and S.-C. Wang

p.249 Characterization of Medium-Range Order in Noncrystalline Systems by Fluctuation X-Ray Microscopy

D. Paterson, L. Fan, I. McNulty, J. M. Gibson and M. M. J. Treacy

p.252 Achievements and Perspectives of Magnetic Soft X-Ray Transmission Microscopy

P. Fischer, D.-H. Kim, B.-S. Kang, W. Chao and E. H. Anderson

p.255 Mapping Very Similar Chemical Components in Micron-Scale Organic Rods by Scanning Transmission X-Ray Microscopy

N. Iwata, K. Tani, A. Watada, H. Ikeura-Sekiguchi, T. Araki and A. P. Hitchcock

p.258 An Energy Tunable Hard X-Ray Microscope for IC Investigation

G.-C. Yin, F. Duewer, Y.-F. Song, M.-T. Tang, W. Yun and K. S. Liang

p.261 Crystallinity Estimation of Strained-Si Wafers by Using Highly Parallel X-Ray Microbeam

Y. Tsusaka, K. Fukuda, N. Tomita, K. Hayashi, Y. Kagoshima, J. Matsui and A. Ogura

p.264 XFH Study of Dilute System Using Cooled APD

K. Hayashi, Y. Takahashi, E. Matsubara, I. Yonenaga and S. Kishimoto

p.267 Development of Scanning Hard X-Ray Microprobe for Element-Specific Magnetic Imaging at SPring-8 BL39XU

M. Takagaki, M. Suzuki, N. Kawamura, H. Mimura and T. Ishikawa

p.270 Nickel Induced Lateral Crystallization of Amorphous Silicon Thin Film Studied by SPESM

I.-H. Hong, T.-C. Hsu, S.-C. Yen, F.-S. Lin, M.-L. Huang and C.-H. Chen

p.273 Atomic Image around Mn Atoms in Diluted Magnetic Semiconductor Zn_0.4Mn_0.6Te Obtained by X-Ray Fluorescence Holography

N. Happo, S. Hosokawa, K. Hayashi, T. Ozaki and K. Horii

p.276 Precise Determination of Irradiated Position on Polymer Materials for X-Ray Microdiffraction: A New Method Using Thomson Scattering

M. Kotera, Y. Kagoshima, T. Koyama and T. Nishino

p.279 Observation of Polymer Blends by X-Ray Phase Tomography

A. Momose, A. Fujii, Y. Suzuki, H. Kadowaki, Y. Nishikawa and H. Jinnai

p.282 Advanced Surface Engineering with a Focused X-Ray Beam

C.-H. Chen, M.-L. Huang, S.-C. Wang, R. Klauser, A. Shaporenko and M. Zharnikov

p.285 Study of Surface Orientation of Carbon Alignment Layers by Polarized PEEM

C.-H. Chen, Y. J. Hsu, H. F. Hsiao, S. C. Wang, W. H. Hung, D. H. Wei and Y. L. Chan

p.288 Bending Magnet X-Ray Polarization Modulation for Magnetic Full-Field Soft X-Ray Transmission Microscopy

B.-S. Kang, P. Fischer, D.-H. Kim, D. Attwood, E. Anderson and G. Cho

p.291 Domain Structures of Patterned Co Thin Films Deposited on Low-Index Cu Surfaces

Y.-L. Chan, J.-H. Sun, Y. J. Hsu, C.-H. Chen and D. H. Wei

p.294 Diffraction-Enhanced X-Ray Imaging of Hydride in α-Titanium and Titanium Alloy

K. Mizuno, T. Kobayashi, F. Fujiki, H. Okamoto, Y. Furuya and K. Hirano

p.297 Evaluation of Hydrogen Diffusion in Alpha-Titanium by Diffraction-Enhanced X-Ray Imaging Technique

H. Okamoto, K. Mizuno, T. Kobayashi, F. Fujiki, Y. Furuya and K. Hirano

p.300 Patterned Magnetic Multilayer Studied by X-Ray PEEM

Y.-L. Chan, J.-H. Sun, C.-H. Chen, S. C. Wang, Y. J. Hsu and D. H. Wei

p.303 Spectromicroscopic Characterization of Monomolecular Lithographic Patterns: the Effect of the Substrate

M.-L. Huang, C.-H. Chen, S.-C. Wang, R. Klauser, A. Shaporenko and M. Zharnikov

p.306 A Tentative Model for the Temperature Gradient Snow Metamorphism and Its First Validations on X-Ray Microtomographic Data

F. Flin, J.-B. Brzoska, R. A. Pieritz, B. Lesaffre, C. Coléou and Y. Furukawa

p.309 Development of a High-Angular-Resolution Microdiffraction System for Reciprocal Space Map Measurements

S. Takeda, S. Kimura, M. Mizumaki, M. Takata, S. Mochizuki, A. Sakai, N. Taoka, O. Nakatsuka, M. Ogawa and S. Zaima

p.312 Optimizing Organic Thin Films from Microspectroscopic Analysis (abstract)

R. H. Fink, T. Schmidt, H. Marchetto and U. Groh

p.313 In Situ STXM: Studies of Wet Electrochemical Systems under Potential Control (abstract)

A. P. Hitchcock, X. Zhang and D. Guay

p.314 X-Ray Projection Microscopy to Investigate Liquid Ga Penetration in Al Bicrystals (abstract)

E. Pereiro-López, W. Ludwig, D. Bellet, P. Cloetens and C. Lemaignan

p.315 Organic Analysis of Extraterrestrial Materials at the Sub-Micron Scale

G. J. Flynn, L. P. Keller, S. Wirick and C. Jacobsen

p.318 Speciation of Sulfur in Oxic and Anoxic Soils Using X-Ray Spectromicroscopy

J. Thieme, J. Prietzel, N. Tyufekchieva, D. Paterson and I. McNulty

p.321 Distribution and XANES of Arsenic in Root of Hyperaccumulator Fern (Pteris vittata L.) Measured by μ-SR-XRF Analysis

N. Kitajima, R. Onuma, A. Hokura, I. Nakai and Y. Terada

p.323 Cadmium Distribution in a Cadmium Hyperaccumulator Plant as Determined by Micro-XRF Imaging

A. Hokura, R. Onuma, N. Kitajima, I. Nakai, Y. Terada, T. Abe, H. Saito and S. Yoshida

p.326 Arsenic Distribution and Speciation in the Arsenic Hyperaccumulator Fern by Micro-XRF Imaging and Micro-XANES Analysis

R. Onuma, A. Hokura, N. Kitajima, I. Nakai, Y. Terada, T. Abe, H. Saito and S. Yoshida

p.328 Study of Fault Rocks by X-Ray Microscopy

Y. F. Song, S. R. Song, M.-T. Tang and G. C. Yin

p.331 Chemical Analysis of Rust on Japanese Smoked Roof Tiles Using Soft X-Ray Spectroscopy

Y. Muramatsu, M. Hirose, M. Motoyama, E. M. Gullikson and R. C. C. Perera

p.334 High-Resolution X-Ray Absorption Spectroscopy Using a Laser Plasma Radiation Source

U. Vogt, T. Wilhein, H. Legall and H. Stiel

p.337 High Resolution Cs-Concentration Mapping by X-Ray CT: Important Data Corrections for Quantitative Accuracy

S. Ikeda, T. Nakano, A. Tsuchiyama, K. Uesugi, Y. Suzuki, K. Nakamura, Y. Nakashima and H. Yoshida

p.340 Microprobe EXAFS at the SRS

A. D. Smith, J. V. Flaherty, J. F. W. Mosselmans, I. Burrows, P. C. Stephenson, J. P. Hindley, W. J. Owens, G. Donaldson and C. M. B. Henderson

p.343 Attainment of < 60 nm Resolution in Phase-Contrast X-Ray Microscopy Using an Add-on to an SEM

S. C. Mayo, P. R. Miller, J. Sheffield-Parker, T. Gureyev and S. W. Wilkins

p.346 Quantitative Phase Imaging and Tomography with Polychromatic X Rays

C. David, T. Weitkamp, T. Khan, F. Pfeiffer, O. Bunk, A. Diaz, T. Rohbeck, A. Groso and M. Stampanoni

p.349 Novel X-Ray Microscopes for 3-D and fs-Imaging at BESSY

G. Schneider, S. Heim, P. Guttmann, S. Rehbein and B. Niemann

p.353 Progress in Three-Dimensional Coherent X-Ray Diffraction Imaging

S. Marchesini, H. N. Chapman, A. Barty, M. R. Howells, C. Cui, J. C. H. Spence, U. Weierstall, A. Noy, S. P. Hau-Riege, J. M. Kinney, D. Shapiro, T. Beetz, C. Jacobsen, E. Lima, A. M. Minor and H. He

p.357 Trace Element Micro-Analysis by Transmission X-Ray Microtomography Using Absorption Edges

K. Okuno, T. Ohigashi, S. Kamiyama, S. Hirai, J. Matsubara, N. Watanabe and S. Aoki

p.360 High-Resolution X-Ray Imaging Microtomography with Fresnel Zone Plate Optics at SPring-8

A. Takeuchi, K. Uesugi, Y. Suzuki, S. Tamura and N. Kamijo

p.363 CT Reconstruction by Diffraction Correction in Soft X-Ray Projection Microscopy

T. Shiina, K. Hotta, Y. Tsuge, T. Honda, H. Yoshimura, Y. Kinjo and A. Ito

p.366 Scanning Transmission X-Ray Microscopy with Momentum Analyzer

Y. Suzuki, A. Takeuchi, K. Uesugi and H. Takano

p.369 Toward Table-Top Time-Resolved Soft X-Ray Microscopy Imaging with a Laboratory High-Harmonic Source at 100 eV

M. Wieland, T. Wilhein, C. Spielmann, U. Kleineberg, T. Westerwalbesloh and U. Heinzmann

p.372 Hard X-Ray Interference Microscope with Two Zone Plates

N. Watanabe, M. Hoshino, M. Sato, Y. Takeda, T. Namiki, S. Aoki, A. Takeuchi and Y. Suzuki

p.375 Reflection Mode Imaging with High Resolution X-Ray Microscopy

G. Denbeaux, P. Fischer, F. Salmassi, K. Dunn and J. Evertsen

p.377 A Fast-Readout CCD System for Configured-Detector Imaging in STXM

G. R. Morrison, A. Gianoncelli, B. Kaulich, D. Bacescu and J. Kovac

p.380 Phase Aberrations in Diffraction Microscopy

S. Marchesini, H. N. Chapman, A. Barty, M. R. Howells, J. C. H. Spence, C. Cui, U. Weierstall and A. M. Minor

p.383 Coherent X-Ray Diffraction Imaging Experiment on ID01 at ESRF

A. Schropp, I. Vartanyants, C. G. Schroer, E. Weckert, C. Mocuta, T. Metzger and O. Kurapova

p.386 Hard X-Ray Diffraction Microscopy at SPring-8

Y. Nishino, J. Miao, Y. Kohmura, Y. Takahashi, C. Song, B. Johnson, M. Yamamoto, K. Koike, T. Ebisuzaki and T. Ishikawa

p.389 Hard X-Ray Micro-Interferometer for High-Spatial-Resolution Phase Measurement

T. Koyama, A. Saikubo, K. Shimose, K. Hayashi, A. Nakagawa, H. Takano, Y. Tsusaka and Y. Kagoshima

p.392 Diffraction Microscopy: Reconstruction of the Complex-Valued Image of a Yeast Cell

E. Lima, D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, X. Huang, C. Jacobsen, J. Kirz, H. Miao, A. M. Neiman, A. Stewart and D. Sayre

p.396 Combined Fluorescence and Phase Contrast Imaging at the Advanced Photon Source

B. Hornberger, M. Feser, C. Jacobsen, S. Vogt, D. Legnini, D. Paterson, P. Rehak, G. DeGeronimo and B. M. Palmer

p.399 X-Ray Image Reconstruction Using the Transport of Intensity Equation

K. A. Nugent

p.403 Phase Contrast Hard X-Ray Microscopy with the Spatial Resolution Better than 100 nm

H. S. Youn and S.-W. Jung

p.407 Recent Theoretical and Experimental Progress in Hard X-Ray Phase Contrast Imaging and CT at BSRF

P. Zhu, J. Wang, Q. Yuan, W. Huang, H. Shu and Z. Wu

p.411 Contrast Enhance Imaging with Microfocus X-Ray Generator and CCD Camera

H. Uchida, K. Hasuike, K. Torii and H. Tsunemi

p.414 Effect of Distorted Illumination Waves on Coherent Diffraction Microscopy

Y. Kohmura, Y. Nishino, T. Ishikawa and J. Miao

p.417 Reproduction of Hologram Image Using a Zone Plate for Hard X-Ray Radiation

A. V. Kuyumchyan, A. Y. Souvorov, T. Ishikawa, A. A. Isoyan and V. V. Aristov

p.420 Phase Imaging with X-Ray Talbot Interferometer Using Gratings Fabricated with LIGA Process

W. Yashiro, Y. Takeda, Y. Suzuki, K. Takiguchi, T. Hattori and A. Momose

p.423 Mach-Zehnder Interference Microscopy Using X-Ray Laser

M. Nishikino, H. Kawazome, M. Tanaka, M. Kishimoto, N. Hasegawa, Y. Ochi, T. Kawachi and K. Nagashima